Automated Optical Inspection

High-resolution wafer inspection platform

Automated production can increase efficiency per square meter , boost capacity, and provide precise and effective judgment.

Particles, air pockets, stains, bumps, through-holes, scratches,

, and defects larger than 10 micrometers can all be easily detected by the equipment.

An intuitive and user-friendly operating interface that is easy to grasp.

Recording defect positions, sizes, types, and preserving data for each instance.

The smaller pixel resolution enables effective detection of tiny defects.

Autofocus ensures clear images for more accurate interpretation.

Light source and camera synchronous compensation control to overcome uneven illumination.